Chemical differentiation of surfaces with various scanning probe microscopies
Masamichi Fujihira*
Department of Biomolecular Engineering, Tokyo Institute of Technology,
Yokohama 226-8501 JAPAN
This is an abstract
for a presentation given at the
Ninth
Foresight Conference on Molecular Nanotechnology.
There will be a link from here to the full article when it is
available on the web.
Recently, chemical force microscopy (CFM) [1] is used as a tool for chemical discrimination of surface chemical species. For CFM, friction force microscopy (FFM) [2], phase-lag imaging in tapping mode atomic force microscopy (TM-AFM) [3], and adhesive force mapping by pulsed-force-mode AFM (PFM-AFM) [4] have been used to discriminate various terminal groups of self-assembled monolayers (SAMs) using the AFM tips covered with SAMs of thiols [5] or organosilanes terminating in a variety of functional groups [6].
In this lecture, we will describe the recent experimental results of CFMs of patterned surfaces with SAMs prepared by microcontact printing [7] and the hydrophobic CH3-terminating domains embedded in the COOH terminating SAM matrix [8]. Both surfaces were observed by PFM-AFM for CFM. We will also discuss the difference in contrast mechanisms of FFM and PFM-AFM based upon the molecular dynamic simulation and the simple phenomeno-logical simulation [9-11]. Chemical differentiation by surface potentials [12,13], SNOM-AFM [14-19], and STM [20] and a mechanism of molecular imaging by contact-AFM [21,22] also will be presented.
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*Corresponding Address:
Masamichi Fujihira
Department of Biomolecular Engineering, Tokyo Institute of Technology
4259 Nagatsuta, Midori-ku, Yokohama 226-8501 JAPAN
Phone: +81-45-924-5784
Fax: +81-45-924-5817
Email: [email protected]
http://www.fujihira.bio.titech.ac.jp
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