Svidinenko Yuriy writes "Ascend Instruments, a manufacturer of value added solutions for nanoscale test and manufacturing, announces Extreme Magic, a revolutionary new technique for enhanced TEM (Transmission Electron Microscopy) sample extraction that eliminates many of the most difficult and time consuming steps from FIB (Focused Ion Beam)-based TEM sample preparation processes. More here: http://www.nanonewsnet.com/index.php?module=pagese tter&func=viewpub&tid=3&pid=18"
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